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Defect Prediction in Software Entities Classified in Terms of Level Dependencies
N.K. Rao1 , R.M. Reddy2 , B.K. Rao3
Section:Research Paper, Product Type: Isroset-Journal
Vol.1 ,
Issue.1 , pp.20-25, Jan-2013
Online published on Dec 12, 2013
Copyright © N.K. Rao, R.M. Reddy, B.K. Rao . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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IEEE Style Citation: N.K. Rao, R.M. Reddy, B.K. Rao, “Defect Prediction in Software Entities Classified in Terms of Level Dependencies,” International Journal of Scientific Research in Computer Science and Engineering, Vol.1, Issue.1, pp.20-25, 2013.
MLA Style Citation: N.K. Rao, R.M. Reddy, B.K. Rao "Defect Prediction in Software Entities Classified in Terms of Level Dependencies." International Journal of Scientific Research in Computer Science and Engineering 1.1 (2013): 20-25.
APA Style Citation: N.K. Rao, R.M. Reddy, B.K. Rao, (2013). Defect Prediction in Software Entities Classified in Terms of Level Dependencies. International Journal of Scientific Research in Computer Science and Engineering, 1(1), 20-25.
BibTex Style Citation:
@article{Rao_2013,
author = {N.K. Rao, R.M. Reddy, B.K. Rao},
title = {Defect Prediction in Software Entities Classified in Terms of Level Dependencies},
journal = {International Journal of Scientific Research in Computer Science and Engineering},
issue_date = {1 2013},
volume = {1},
Issue = {1},
month = {1},
year = {2013},
issn = {2347-2693},
pages = {20-25},
url = {https://www.isroset.org/journal/IJSRCSE/full_paper_view.php?paper_id=17},
publisher = {IJCSE, Indore, INDIA},
}
RIS Style Citation:
TY - JOUR
UR - https://www.isroset.org/journal/IJSRCSE/full_paper_view.php?paper_id=17
TI - Defect Prediction in Software Entities Classified in Terms of Level Dependencies
T2 - International Journal of Scientific Research in Computer Science and Engineering
AU - N.K. Rao, R.M. Reddy, B.K. Rao
PY - 2013
DA - 2012/12/12
PB - IJCSE, Indore, INDIA
SP - 20-25
IS - 1
VL - 1
SN - 2347-2693
ER -
Abstract :
Unit testing is the core fundamental to ensure code is in accordance with the design specifications. The coding and unit testing standard reflects the stability of project (not to mention the testing effort).Code stability is greatly influenced by the efforts of unit testing, which can be automated to reduce the human efforts. In spite of several tools identified for unit testing, tools need to be able to identify the level dependencies or depth of program entity usage in software fragments. This factor greatly influences unit testing complexity. Higher the level of dependency, the greater the complexity of unit testing the code. Here based on level dependencies we predict defects in any expression. A predicting defect-prone software component is an economically important activity and so has received a good deal of attention. However, making sense of the many, and sometimes seemingly inconsistent, a result is difficult. The main objectives of this paper are unbiased and comprehensive comparison between competing prediction systems. This paper mainly focuses on two learning algorithms OneR, Naive Bayes. By using those two algorithms we calculate the error rate. We can predict defects based on those error rates.
Key-Words / Index Term :
Unit Testing, Level Dependency, Defect Prediction
References :
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