Effect of post-annealing temperature on linear and non-linear optical properties of sol-gel spin coated CdS thin films

M. Venkata Veera Prasad¹ , K. Thyagarajan² , B. Rajesh Kumar³

Section:Research Paper, Product Type: Isroset-Journal
Vol.7 , Issue.3 , pp.182-189, Jun-2019

CrossRef-DOI:   https://doi.org/10.26438/ijsrpas/v7i3.182189

Online published on Jun 30, 2019

Copyright © M. Venkata Veera Prasad, K. Thyagarajan, B. Rajesh Kumar . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
 

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Abstract :
Cadmium sulfide thin films were prepared by sol-gel spin coating method on glass substrates and its effect of post-annealing temperature on linear and non-linear optical properties were investigated. X-ray diffraction results showed that the grown CdS thin films exhibit cubic phase with (1 1 1) as a preferential orientation. The surface morphology of CdS thin films was characterized by using atomic force microscopy. The electrical resistivity of CdS thin films measured from the four-probe method decreased from 0.74 Ă— 104 to 0.12 Ă— 104 Ω.cm with the increase of post-annealing temperature from 150 to 300°C. The optical band gap of CdS thin films is found to be 2.42 eV, whereas its band gap decreased from 2.35 to 2.21 eV with the increase of post-annealing temperature from 150 to 300°C. The normal dispersion of refractive index for CdS thin films was described using Wemple-DiDomenico single-oscillator model. The optical dispersion parameters for CdS thin films were reported in this study. The Verdet constant is calculated based on the refractive index dispersion study. The first, third order nonlinear optical susceptibility (χ(1) , χ(3)) and nonlinear refractive index n(2) were also determined.

Key-Words / Index Term :
Sol-gel spin coating; CdS thin films; X-ray diffraction; Atomic force microscopy; Optical properties.

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