Investigation on the Structural and Dielectric Properties of The Sr2SiO4:Eu2+, Dy3+ Nano-material

M. Somani¹ , M. Saleem² , M.Mittal ³

1. Dept. of Physics, Govt. Holkar [Autonomous] Science College, Indore, India.
2. School of Physics, Devi Ahilya University, Indore, India.
3. Department of Physics, Govt. PG Girls College, Indore, India.

Correspondence should be addressed to: monikasomani88@gmail.com.

Section:Research Paper, Product Type: Isroset-Journal
Vol.5 , Issue.3 , pp.1-5, Jun-2017

Online published on Jun 30, 2017

Copyright © M. Somani, M. Saleem, M.Mittal . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
 

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Abstract :
The material has been successfully prepared by the most convenient solid stare reaction route method. The material has been structurally analyzed using X-ray Diffraction (XRD). The sample has been found to be crystalline, single phase with particle size of the order of 80nm. The sample was found to exhibit the orthorhombic structure with the space group Pnma. The so obtained XRD pattern was Retvield refined which confirmed the purity, single phase and orthorhombic structure. The dielectric measurements have been carried out which indicated that the as prepared sample is a good dielectric material. The loss is low. The dielectric constant decreases initially at low frequency and attains a minimum value which later at higher frequency tends to increase again. The loss initially is found to increase and after attaining a peak value, it decreases smoothly and tends to obtain a lower value of dielectric loss but shows a sign of increase at higher frequency.

Key-Words / Index Term :
Nanoparticles; X-ray diffraction; Retvield Refinement; dielectric

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