Characterization of Copper(II) complexes of Schiff base derived from benzil-2,4-dinitrophenylhydrazone with anilines using x-ray diffraction and Extended X-ray absorption Fine Structure (XRD & EXAFS)

Sushma Patidar¹ , A. Mishra² , K.S. Sura³ , S. Mohammad⁴

1. School of Physics, DAVV, Indore (M.P), India.
2. School of Physics, DAVV, Indore (M.P), India.
3. School of Physics, DAVV, Indore (M.P), India.
4. School of Physics, DAVV, Indore (M.P), India.

Correspondence should be addressed to: sn2704@gmail.com.

Section:Research Paper, Product Type: Isroset-Journal
Vol.6 , Issue.2 , pp.64-66, Apr-2018

CrossRef-DOI:   https://doi.org/10.26438/ijsrpas/v6i2.6466

Online published on Apr 30, 2018

Copyright © Sushma Patidar, A. Mishra, K.S. Sura, S. Mohammad . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
 

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Abstract :
Schiff base chelates of Cu (II) derived from benzil-2,4-dinitro-phenylhydrazone with different anilines have been synthesized. These complexes have been prepared by chemical root method. The XRD and EXAFS characterization of the prepared complexes have been carried out. From XRD particle size and lattice parameter have been estimated and the XRD analysis revealed the crystalline nature of all complexes. These complexes have also been characterized by Cu K-Edge EXAFS measurements using the dispersive beam line at 2.5 GeV Indus-2 synchrotron radiation source at RRCAT (Raja Ramanna Centre for Advance Technology), Indore, India. The measured EXAFS data have been analyzed to compute average metal-ligand bond length using Levy’s, LSS, Lytle’s, Fourier transform methods, with the help of computer software ATHENA.

Key-Words / Index Term :
XRD, EXAFS, Bond-length, Benzil-2,4-dinitrophenylhydrazone

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