Life Test Sampling Plans Based on Marshall – Olkin Extended Exponential Distribution

R. Vijayaraghavan¹ , C. R. Saranya² , K. Sathya Narayana Sharma³

Section:Research Paper, Product Type: Isroset-Journal
Vol.6 , Issue.2 , pp.131-139, Apr-2019

CrossRef-DOI:   https://doi.org/10.26438/ijsrmss/v6i2.131139

Online published on Apr 30, 2019

Copyright © R. Vijayaraghavan, C. R. Saranya, K. Sathya Narayana Sharma . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
 

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Abstract :
Sampling inspection plans for life tests, termed as reliability sampling plans, are the special procedures that are employed to determine the acceptability or non-acceptability of a lot of finished items by carrying out tests of lifetime of the items drawn randomly from the lot and observing the number of failures of items. A specific life test sampling plan can be developed considering the lifetime of the products as the quality characteristic, which is modelled by an appropriate continuous-type probability distribution. Various procedures and rules for the design and evaluation of life test sampling plans based on the tests of sampled lifetime data have been developed and are found in the literature of product control. In this paper, evaluation of life test sampling plans under the conditions for application of Marshall – Olkin extended exponential distribution is considered. Three different criteria for designing life test plans when lot quality is evaluated in terms of mean life, hazard rate and reliability life are proposed. Factors for adapting MIL-STD-105D to life and reliability testing indexed by acceptable quality level under the assumption of Marshall – Olkin extended exponential distribution are also illustrated.

Key-Words / Index Term :
Acceptable mean life, Hazard rate, Marshall – Olkin Extended Exponential Distribution, Mean life, Reliable life, Reliability sampling

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